coresight-tpdm: Add integration test support
Integration test for tpdm can help to generate the data for verification of the topology during TPDM software bring up. Sample: echo 1 > /sys/bus/coresight/devices/tmc_etf0/enable_sink echo 1 > /sys/bus/coresight/devices/tpdm0/enable_source echo 1 > /sys/bus/coresight/devices/tpdm0/integration_test echo 2 > /sys/bus/coresight/devices/tpdm0/integration_test cat /dev/tmc_etf0 > /data/etf-tpdm0.bin Reviewed-by: Suzuki K Poulose <suzuki.poulose@arm.com> Signed-off-by: Tao Zhang <quic_taozha@quicinc.com> Signed-off-by: Mao Jinlong <quic_jinlmao@quicinc.com> Signed-off-by: Suzuki K Poulose <suzuki.poulose@arm.com> Link: https://lore.kernel.org/r/20230117145708.16739-6-quic_jinlmao@quicinc.com
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@ -0,0 +1,13 @@
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What: /sys/bus/coresight/devices/<tpdm-name>/integration_test
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Date: January 2023
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KernelVersion 6.2
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Contact: Jinlong Mao (QUIC) <quic_jinlmao@quicinc.com>, Tao Zhang (QUIC) <quic_taozha@quicinc.com>
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Description:
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(Write) Run integration test for tpdm. Integration test
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will generate test data for tpdm. It can help to make
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sure that the trace path is enabled and the link configurations
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are fine.
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Accepts only one of the 2 values - 1 or 2.
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1 : Generate 64 bits data
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2 : Generate 32 bits data
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@ -121,6 +121,59 @@ static void tpdm_init_default_data(struct tpdm_drvdata *drvdata)
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CS_LOCK(drvdata->base);
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}
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/*
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* value 1: 64 bits test data
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* value 2: 32 bits test data
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*/
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static ssize_t integration_test_store(struct device *dev,
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struct device_attribute *attr,
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const char *buf,
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size_t size)
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{
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int i, ret = 0;
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unsigned long val;
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struct tpdm_drvdata *drvdata = dev_get_drvdata(dev->parent);
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ret = kstrtoul(buf, 10, &val);
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if (ret)
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return ret;
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if (val != 1 && val != 2)
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return -EINVAL;
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if (!drvdata->enable)
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return -EINVAL;
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if (val == 1)
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val = ATBCNTRL_VAL_64;
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else
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val = ATBCNTRL_VAL_32;
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CS_UNLOCK(drvdata->base);
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writel_relaxed(0x1, drvdata->base + TPDM_ITCNTRL);
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for (i = 0; i < INTEGRATION_TEST_CYCLE; i++)
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writel_relaxed(val, drvdata->base + TPDM_ITATBCNTRL);
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writel_relaxed(0, drvdata->base + TPDM_ITCNTRL);
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CS_LOCK(drvdata->base);
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return size;
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}
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static DEVICE_ATTR_WO(integration_test);
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static struct attribute *tpdm_attrs[] = {
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&dev_attr_integration_test.attr,
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NULL,
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};
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static struct attribute_group tpdm_attr_grp = {
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.attrs = tpdm_attrs,
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};
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static const struct attribute_group *tpdm_attr_grps[] = {
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&tpdm_attr_grp,
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NULL,
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};
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static int tpdm_probe(struct amba_device *adev, const struct amba_id *id)
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{
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void __iomem *base;
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@ -157,6 +210,7 @@ static int tpdm_probe(struct amba_device *adev, const struct amba_id *id)
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desc.pdata = adev->dev.platform_data;
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desc.dev = &adev->dev;
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desc.access = CSDEV_ACCESS_IOMEM(base);
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desc.groups = tpdm_attr_grps;
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drvdata->csdev = coresight_register(&desc);
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if (IS_ERR(drvdata->csdev))
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return PTR_ERR(drvdata->csdev);
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@ -14,6 +14,20 @@
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/* Enable bit for DSB subunit */
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#define TPDM_DSB_CR_ENA BIT(0)
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/* TPDM integration test registers */
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#define TPDM_ITATBCNTRL (0xEF0)
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#define TPDM_ITCNTRL (0xF00)
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/* Register value for integration test */
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#define ATBCNTRL_VAL_32 0xC00F1409
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#define ATBCNTRL_VAL_64 0xC01F1409
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/*
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* Number of cycles to write value when
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* integration test.
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*/
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#define INTEGRATION_TEST_CYCLE 10
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/**
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* The bits of PERIPHIDR0 register.
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* The fields [6:0] of PERIPHIDR0 are used to determine what
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