USB: keyspan_pda: remove bogus disconnect test in close

Remove bogus (and unnecessary) test for serial->dev being NULL in close.

The device is never cleared, and close is never called after a completed
disconnect anyway.

Signed-off-by: Johan Hovold <jhovold@gmail.com>
Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
This commit is contained in:
Johan Hovold 2013-03-21 12:36:34 +01:00 коммит произвёл Greg Kroah-Hartman
Родитель d7f08452ff
Коммит 75d22b323f
1 изменённых файлов: 2 добавлений и 7 удалений

Просмотреть файл

@ -649,13 +649,8 @@ error:
}
static void keyspan_pda_close(struct usb_serial_port *port)
{
struct usb_serial *serial = port->serial;
if (serial->dev) {
/* shutdown our bulk reads and writes */
usb_kill_urb(port->write_urb);
usb_kill_urb(port->interrupt_in_urb);
}
usb_kill_urb(port->write_urb);
usb_kill_urb(port->interrupt_in_urb);
}