sfc: Disable VF queues during register self-test
Currently VF queues and drivers may remain active during this test. This could cause memory corruption or spurious test failures. Therefore we reset the port/function before running these tests on Siena. On Falcon this doesn't work: we have to do some additional initialisation before some blocks will work again. So refactor the reset/register-test sequence into an efx_nic_type method so efx_selftest() doesn't have to consider such quirks. In the process, fix another minor bug: Siena does not have an 'invisible' reset and the self-test currently fails to push the PHY configuration after resetting. Passing RESET_TYPE_ALL to efx_reset_{down,up}() fixes this. Signed-off-by: Ben Hutchings <bhutchings@solarflare.com>
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0f1e54ae52
Коммит
d4f2cecce1
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@ -25,9 +25,12 @@
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#include "io.h"
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#include "phy.h"
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#include "workarounds.h"
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#include "selftest.h"
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/* Hardware control for SFC4000 (aka Falcon). */
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static int falcon_reset_hw(struct efx_nic *efx, enum reset_type method);
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static const unsigned int
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/* "Large" EEPROM device: Atmel AT25640 or similar
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* 8 KB, 16-bit address, 32 B write block */
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@ -1034,10 +1037,34 @@ static const struct efx_nic_register_test falcon_b0_register_tests[] = {
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EFX_OWORD32(0x0003FF0F, 0x00000000, 0x00000000, 0x00000000) },
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};
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static int falcon_b0_test_registers(struct efx_nic *efx)
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static int
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falcon_b0_test_chip(struct efx_nic *efx, struct efx_self_tests *tests)
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{
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return efx_nic_test_registers(efx, falcon_b0_register_tests,
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ARRAY_SIZE(falcon_b0_register_tests));
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enum reset_type reset_method = RESET_TYPE_INVISIBLE;
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int rc, rc2;
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mutex_lock(&efx->mac_lock);
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if (efx->loopback_modes) {
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/* We need the 312 clock from the PHY to test the XMAC
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* registers, so move into XGMII loopback if available */
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if (efx->loopback_modes & (1 << LOOPBACK_XGMII))
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efx->loopback_mode = LOOPBACK_XGMII;
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else
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efx->loopback_mode = __ffs(efx->loopback_modes);
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}
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__efx_reconfigure_port(efx);
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mutex_unlock(&efx->mac_lock);
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efx_reset_down(efx, reset_method);
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tests->registers =
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efx_nic_test_registers(efx, falcon_b0_register_tests,
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ARRAY_SIZE(falcon_b0_register_tests))
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? -1 : 1;
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rc = falcon_reset_hw(efx, reset_method);
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rc2 = efx_reset_up(efx, reset_method, rc == 0);
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return rc ? rc : rc2;
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}
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/**************************************************************************
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@ -1818,7 +1845,7 @@ const struct efx_nic_type falcon_b0_nic_type = {
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.get_wol = falcon_get_wol,
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.set_wol = falcon_set_wol,
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.resume_wol = efx_port_dummy_op_void,
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.test_registers = falcon_b0_test_registers,
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.test_chip = falcon_b0_test_chip,
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.test_nvram = falcon_test_nvram,
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.revision = EFX_REV_FALCON_B0,
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@ -68,6 +68,8 @@
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#define EFX_TXQ_TYPES 4
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#define EFX_MAX_TX_QUEUES (EFX_TXQ_TYPES * EFX_MAX_CHANNELS)
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struct efx_self_tests;
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/**
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* struct efx_special_buffer - An Efx special buffer
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* @addr: CPU base address of the buffer
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@ -901,7 +903,8 @@ static inline unsigned int efx_port_num(struct efx_nic *efx)
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* @get_wol: Get WoL configuration from driver state
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* @set_wol: Push WoL configuration to the NIC
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* @resume_wol: Synchronise WoL state between driver and MC (e.g. after resume)
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* @test_registers: Test read/write functionality of control registers
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* @test_chip: Test registers. Should use efx_nic_test_registers(), and is
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* expected to reset the NIC.
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* @test_nvram: Test validity of NVRAM contents
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* @revision: Hardware architecture revision
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* @mem_map_size: Memory BAR mapped size
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@ -946,7 +949,7 @@ struct efx_nic_type {
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void (*get_wol)(struct efx_nic *efx, struct ethtool_wolinfo *wol);
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int (*set_wol)(struct efx_nic *efx, u32 type);
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void (*resume_wol)(struct efx_nic *efx);
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int (*test_registers)(struct efx_nic *efx);
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int (*test_chip)(struct efx_nic *efx, struct efx_self_tests *tests);
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int (*test_nvram)(struct efx_nic *efx);
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int revision;
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@ -124,9 +124,6 @@ int efx_nic_test_registers(struct efx_nic *efx,
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unsigned address = 0, i, j;
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efx_oword_t mask, imask, original, reg, buf;
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/* Falcon should be in loopback to isolate the XMAC from the PHY */
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WARN_ON(!LOOPBACK_INTERNAL(efx));
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for (i = 0; i < n_regs; ++i) {
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address = regs[i].address;
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mask = imask = regs[i].mask;
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@ -120,19 +120,6 @@ static int efx_test_nvram(struct efx_nic *efx, struct efx_self_tests *tests)
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return rc;
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}
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static int efx_test_chip(struct efx_nic *efx, struct efx_self_tests *tests)
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{
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int rc = 0;
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/* Test register access */
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if (efx->type->test_registers) {
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rc = efx->type->test_registers(efx);
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tests->registers = rc ? -1 : 1;
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}
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return rc;
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}
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/**************************************************************************
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*
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* Interrupt and event queue testing
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@ -699,8 +686,7 @@ int efx_selftest(struct efx_nic *efx, struct efx_self_tests *tests,
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{
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enum efx_loopback_mode loopback_mode = efx->loopback_mode;
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int phy_mode = efx->phy_mode;
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enum reset_type reset_method = RESET_TYPE_INVISIBLE;
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int rc_test = 0, rc_reset = 0, rc;
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int rc_test = 0, rc_reset, rc;
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efx_selftest_async_cancel(efx);
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@ -737,44 +723,26 @@ int efx_selftest(struct efx_nic *efx, struct efx_self_tests *tests,
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*/
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netif_device_detach(efx->net_dev);
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mutex_lock(&efx->mac_lock);
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if (efx->loopback_modes) {
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/* We need the 312 clock from the PHY to test the XMAC
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* registers, so move into XGMII loopback if available */
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if (efx->loopback_modes & (1 << LOOPBACK_XGMII))
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efx->loopback_mode = LOOPBACK_XGMII;
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else
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efx->loopback_mode = __ffs(efx->loopback_modes);
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if (efx->type->test_chip) {
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rc_reset = efx->type->test_chip(efx, tests);
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if (rc_reset) {
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netif_err(efx, hw, efx->net_dev,
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"Unable to recover from chip test\n");
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efx_schedule_reset(efx, RESET_TYPE_DISABLE);
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return rc_reset;
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}
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if ((tests->registers < 0) && !rc_test)
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rc_test = -EIO;
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}
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__efx_reconfigure_port(efx);
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mutex_unlock(&efx->mac_lock);
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/* free up all consumers of SRAM (including all the queues) */
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efx_reset_down(efx, reset_method);
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rc = efx_test_chip(efx, tests);
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if (rc && !rc_test)
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rc_test = rc;
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/* reset the chip to recover from the register test */
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rc_reset = efx->type->reset(efx, reset_method);
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/* Ensure that the phy is powered and out of loopback
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* for the bist and loopback tests */
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mutex_lock(&efx->mac_lock);
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efx->phy_mode &= ~PHY_MODE_LOW_POWER;
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efx->loopback_mode = LOOPBACK_NONE;
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rc = efx_reset_up(efx, reset_method, rc_reset == 0);
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if (rc && !rc_reset)
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rc_reset = rc;
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if (rc_reset) {
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netif_err(efx, drv, efx->net_dev,
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"Unable to recover from chip test\n");
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efx_schedule_reset(efx, RESET_TYPE_DISABLE);
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return rc_reset;
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}
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__efx_reconfigure_port(efx);
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mutex_unlock(&efx->mac_lock);
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rc = efx_test_phy(efx, tests, flags);
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if (rc && !rc_test)
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@ -25,10 +25,12 @@
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#include "workarounds.h"
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#include "mcdi.h"
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#include "mcdi_pcol.h"
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#include "selftest.h"
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/* Hardware control for SFC9000 family including SFL9021 (aka Siena). */
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static void siena_init_wol(struct efx_nic *efx);
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static int siena_reset_hw(struct efx_nic *efx, enum reset_type method);
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static void siena_push_irq_moderation(struct efx_channel *channel)
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EFX_OWORD32(0xFFFFFFFF, 0xFFFFFFFF, 0x00000007, 0x00000000) },
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};
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static int siena_test_registers(struct efx_nic *efx)
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static int siena_test_chip(struct efx_nic *efx, struct efx_self_tests *tests)
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{
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return efx_nic_test_registers(efx, siena_register_tests,
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ARRAY_SIZE(siena_register_tests));
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enum reset_type reset_method = reset_method;
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int rc, rc2;
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efx_reset_down(efx, reset_method);
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/* Reset the chip immediately so that it is completely
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* quiescent regardless of what any VF driver does.
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*/
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rc = siena_reset_hw(efx, reset_method);
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if (rc)
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goto out;
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tests->registers =
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efx_nic_test_registers(efx, siena_register_tests,
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ARRAY_SIZE(siena_register_tests))
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? -1 : 1;
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rc = siena_reset_hw(efx, reset_method);
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out:
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rc2 = efx_reset_up(efx, reset_method, rc == 0);
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return rc ? rc : rc2;
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}
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/**************************************************************************
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.get_wol = siena_get_wol,
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.set_wol = siena_set_wol,
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.resume_wol = siena_init_wol,
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.test_registers = siena_test_registers,
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.test_chip = siena_test_chip,
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.test_nvram = efx_mcdi_nvram_test_all,
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.revision = EFX_REV_SIENA_A0,
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